Class-Specific Interferometric Phase Estimation Using Patch-Based Importance Sampling

Interferometric phase (InPhase) estimation, that is, the denoising of modulo-2π phase images from sinusoidal 2π-periodic and noisy observations, is a challenging inverse problem with wide applications in many coherent imaging techniques. This paper introduces a novel approach t...

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Bibliographic Details
Main Authors: Joshin P. Krishnan, Mario A. T. Figueiredo, Jose M. Bioucas-Dias
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9184837/