Class-Specific Interferometric Phase Estimation Using Patch-Based Importance Sampling
Interferometric phase (InPhase) estimation, that is, the denoising of modulo-2π phase images from sinusoidal 2π-periodic and noisy observations, is a challenging inverse problem with wide applications in many coherent imaging techniques. This paper introduces a novel approach t...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9184837/ |