The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault

The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault

Reliability is one of the critical issues for a modular multilevel converter (MMC) since it consists of a large number of series-connected power electronics submodules (SMs). In this paper, a complete control strategy including fault detection, localization, and tolerant operation is proposed for th...

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Bibliographic Details
Main Authors: Wei Li, Gengyin Li, Rong Zeng, Kai Ni, Yihua Hu, Huiqing Wen
Format: Article
Language:English
Published: MDPI AG 2018-04-01
Series:Energies
Subjects:
modular multi-level converter
fault detection
circulating current
output current observation
fault localization
fault-tolerant operation
Online Access:http://www.mdpi.com/1996-1073/11/4/837

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http://www.mdpi.com/1996-1073/11/4/837

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