Fabric Defect Detection Using Activation Layer Embedded Convolutional Neural Network

Loom malfunctions are the main cause of faulty fabric production. A fabric inspection system is a specialized computer vision system used to detect fabric defects for quality assurance. In this paper, a deep-learning algorithm was developed for an on-loom fabric defect inspection system by combining...

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Bibliographic Details
Main Authors: Wenbin Ouyang, Bugao Xu, Jue Hou, Xiaohui Yuan
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8701450/