Improving the calibration of phase measuring deflectometry by a polynomial representation of the display shape
Abstract Background Phase measuring deflectometry is a highly precise and full field metrology technique for specular surfaces based on the distortion of known reference patterns observed as a reflection at the surface under test. Typically, liquid crystal displays are employed to provide the requir...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2019-09-01
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Series: | Journal of the European Optical Society-Rapid Publications |
Subjects: | |
Online Access: | http://link.springer.com/article/10.1186/s41476-019-0116-1 |