Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm
The parametric fault diagnosis of analog circuits is very crucial for condition-based maintenance (CBM) in prognosis and health management. In order to improve the diagnostic rate of parametric faults in engineering applications, a semi-supervised machine learning algorithm was used to classify the...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-02-01
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| Series: | Symmetry |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-8994/11/2/228 |