Multi-Level Switching of Al-Doped HfO<sub>2</sub> RRAM with a Single Voltage Amplitude Set Pulse

In this paper, the resistive switching characteristics in a Ti/HfO<sub>2</sub>: Al/Pt sandwiched structure are investigated for gradual conductance tuning inherent functions. The variation in conductance of the device under different amplitudes and voltage pulse widths is studied. At the...

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Bibliographic Details
Main Authors: Jinfu Lin, Shulong Wang, Hongxia Liu
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/10/6/731
Description
Summary:In this paper, the resistive switching characteristics in a Ti/HfO<sub>2</sub>: Al/Pt sandwiched structure are investigated for gradual conductance tuning inherent functions. The variation in conductance of the device under different amplitudes and voltage pulse widths is studied. At the same time, it was found that the variation in switching parameters in resistive random-access memory (RRAM) under impulse response is impacted by the initial conductance states. The device was brought to a preset resistance value range by energizing a single voltage amplitude pulse with a different number of periodicities. This is an efficient and simple programming algorithm to simulate the strength change observed in biological synapses. It exhibited an on/off of about 100, an endurance of over 500 cycles, and a lifetime (at 85 °C) of around 10<sup>5</sup> s. This multi-level switching two-terminal device can be used for neuromorphic applications to simulate the gradual potentiation (increasing conductance) and inhibition (decreasing conductance) in an artificial synapse.
ISSN:2079-9292