Effect of load sequence interaction on bond-wire lifetime due to power cycling

Abstract Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ( $$\Delta T_{j}$$ Δ T j ) and the heating duration ( $$t_{ON}$$ t ON ) are i...

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Bibliographic Details
Main Authors: Zoubir Khatir, Son-Ha Tran, Ali Ibrahim, Richard Lallemand, Nicolas Degrenne
Format: Article
Language:English
Published: Nature Publishing Group 2021-03-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-84976-2