Beam profile indicator for swift heavy ions using phosphor afterglow
In this letter, we report a beam profile indicator for swift heavy ions (SHIs) which utilizes the afterglow of phosphors. Clear marks are left on SrAl2O4:Eu2+ and CaSrAl2Si2O8:Eu2+ samples by SHI irradiation through a permanent change of their afterglow intensity. The afterglow intensity of the SHI-...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2012-09-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4739407 |