Size Measurement of Nanoparticle Assembly Using Multilevel Segmented TEM Images
Multilevel image segmentation is demonstrated as a rapid and accurate method of quantitative analysis for nanoparticle assembly in TEM images. The procedure incorporating K-means clustering algorithm and watershed transform is tested on transmission electron microscope (TEM) images of FePt-based nan...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2015-01-01
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Series: | Journal of Nanomaterials |
Online Access: | http://dx.doi.org/10.1155/2015/790508 |