Size Measurement of Nanoparticle Assembly Using Multilevel Segmented TEM Images

Multilevel image segmentation is demonstrated as a rapid and accurate method of quantitative analysis for nanoparticle assembly in TEM images. The procedure incorporating K-means clustering algorithm and watershed transform is tested on transmission electron microscope (TEM) images of FePt-based nan...

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Bibliographic Details
Main Authors: Paisarn Muneesawang, Chitnarong Sirisathitkul
Format: Article
Language:English
Published: Hindawi Limited 2015-01-01
Series:Journal of Nanomaterials
Online Access:http://dx.doi.org/10.1155/2015/790508