Nanolithography-induced exfoliation of layered materials
We present a comparative study of nanoexfoliation on bulk, layered materials (MoS2, WSe2, HOPG, and mica) conducted via atomic force microscopy (AFM). The samples were scratched by single crystal diamond probes with varying scan velocities and normal forces. Friction forces measured during the scrat...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2021-12-01
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| Series: | Applied Surface Science Advances |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2666523921000921 |