Testing digital instruments and power systems devices

Testing digital instruments and power systems devices

Discussed here is a technique for testing digital devices based on the calculation and control of two or more characteristics of a binary electric signal at a reference point. Signals coming from a healthy and failed digital device that are indistinguishable by the value of one of the characteristic...

Full description

Bibliographic Details
Main Authors: Pavlov Pavel, Fandeev Vladimir, Butakov Valery, Baymeeva Dilyara, Safiullina Venera
Format: Article
Language:English
Published: EDP Sciences 2020-01-01
Series:E3S Web of Conferences
Online Access:https://www.e3s-conferences.org/articles/e3sconf/pdf/2020/76/e3sconf_rses2020_01063.pdf
id doaj-4d5e437a84144401aaa5334aba720802
record_format Article
spelling doaj-4d5e437a84144401aaa5334aba7208022021-04-02T18:46:53ZengEDP SciencesE3S Web of Conferences2267-12422020-01-012160106310.1051/e3sconf/202021601063e3sconf_rses2020_01063Testing digital instruments and power systems devicesPavlov Pavel0Fandeev Vladimir1Butakov Valery2Baymeeva Dilyara3Safiullina Venera4Kazan State Power Engineering UniversityPenza State UniversityKazan State Power Engineering UniversityKazan State Power Engineering UniversityKazan State Power Engineering UniversityDiscussed here is a technique for testing digital devices based on the calculation and control of two or more characteristics of a binary electric signal at a reference point. Signals coming from a healthy and failed digital device that are indistinguishable by the value of one of the characteristics may differ in value of the other characteristic. The combination of test methods can significantly reduce the potential of not detecting the failure of digital device. The technique is aimed at increasing the information content of the healthy state monitoring results and the possibility of localizing failures in digital instruments and devices of power systems.https://www.e3s-conferences.org/articles/e3sconf/pdf/2020/76/e3sconf_rses2020_01063.pdf
collection DOAJ
language English
format Article
sources DOAJ
author Pavlov Pavel
Fandeev Vladimir
Butakov Valery
Baymeeva Dilyara
Safiullina Venera
spellingShingle Pavlov Pavel
Fandeev Vladimir
Butakov Valery
Baymeeva Dilyara
Safiullina Venera
Testing digital instruments and power systems devices
E3S Web of Conferences
author_facet Pavlov Pavel
Fandeev Vladimir
Butakov Valery
Baymeeva Dilyara
Safiullina Venera
author_sort Pavlov Pavel
title Testing digital instruments and power systems devices
title_short Testing digital instruments and power systems devices
title_full Testing digital instruments and power systems devices
title_fullStr Testing digital instruments and power systems devices
title_full_unstemmed Testing digital instruments and power systems devices
title_sort testing digital instruments and power systems devices
publisher EDP Sciences
series E3S Web of Conferences
issn 2267-1242
publishDate 2020-01-01
description Discussed here is a technique for testing digital devices based on the calculation and control of two or more characteristics of a binary electric signal at a reference point. Signals coming from a healthy and failed digital device that are indistinguishable by the value of one of the characteristics may differ in value of the other characteristic. The combination of test methods can significantly reduce the potential of not detecting the failure of digital device. The technique is aimed at increasing the information content of the healthy state monitoring results and the possibility of localizing failures in digital instruments and devices of power systems.
url https://www.e3s-conferences.org/articles/e3sconf/pdf/2020/76/e3sconf_rses2020_01063.pdf
work_keys_str_mv AT pavlovpavel testingdigitalinstrumentsandpowersystemsdevices
AT fandeevvladimir testingdigitalinstrumentsandpowersystemsdevices
AT butakovvalery testingdigitalinstrumentsandpowersystemsdevices
AT baymeevadilyara testingdigitalinstrumentsandpowersystemsdevices
AT safiullinavenera testingdigitalinstrumentsandpowersystemsdevices
_version_ 1721550903458136064

Similar Items