Testing digital instruments and power systems devices
Discussed here is a technique for testing digital devices based on the calculation and control of two or more characteristics of a binary electric signal at a reference point. Signals coming from a healthy and failed digital device that are indistinguishable by the value of one of the characteristic...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2020-01-01
|
| Series: | E3S Web of Conferences |
| Online Access: | https://www.e3s-conferences.org/articles/e3sconf/pdf/2020/76/e3sconf_rses2020_01063.pdf |