A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillatio...

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Bibliographic Details
Main Authors: Manfred Lange, Dennis van Vörden, Rolf Möller
Format: Article
Language:English
Published: Beilstein-Institut 2012-03-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
energy dissipation
force spectroscopy
hysteresis loop
PTCDA/Ag/Si(111) √3 × √3
Online Access:https://doi.org/10.3762/bjnano.3.23

Internet

https://doi.org/10.3762/bjnano.3.23

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