GaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporation
We report the use of two Raman signatures, the Bi-induced longitudinal-optical-plasmon-coupled (LOPC) mode and the GaAs Fröhlich scattering intensity, present in nominally undoped (100) GaAs1−yBiy to predict the 300K photoluminescence intensity and Bi composition (y) in GaAs1−yBiy. The LOPC mode is...
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Online Access: | http://dx.doi.org/10.1063/1.4922139 |
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doaj-4ce2b0b0dd424bb598a64102acd640fa2020-11-25T00:40:28ZengAIP Publishing LLCAIP Advances2158-32262015-06-0156067103067103-610.1063/1.4922139003506ADVGaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporationJincheng Li0Kamran Forghani1Yingxin Guan2Wenyuan Jiao3Wei Kong4Kristen Collar5Tong-Ho Kim6Thomas F. Kuech7April S. Brown8Department of Electrical and Computer Engineering, Duke University, Durham, NC, 27708 USADepartment of Chemical and Biological Engineering, University of Wisconsin-Madison, Madison, WI 53706 USADepartment of Chemical and Biological Engineering, University of Wisconsin-Madison, Madison, WI 53706 USADepartment of Electrical and Computer Engineering, Duke University, Durham, NC, 27708 USADepartment of Electrical and Computer Engineering, Duke University, Durham, NC, 27708 USADepartment of Physics, Duke University, Durham, NC, 27708 USADepartment of Electrical and Computer Engineering, Duke University, Durham, NC, 27708 USADepartment of Chemical and Biological Engineering, University of Wisconsin-Madison, Madison, WI 53706 USADepartment of Electrical and Computer Engineering, Duke University, Durham, NC, 27708 USAWe report the use of two Raman signatures, the Bi-induced longitudinal-optical-plasmon-coupled (LOPC) mode and the GaAs Fröhlich scattering intensity, present in nominally undoped (100) GaAs1−yBiy to predict the 300K photoluminescence intensity and Bi composition (y) in GaAs1−yBiy. The LOPC mode is used to calculate the hole concentration in GaAs1−yBiy epitaxial layers. A linear relationship between hole concentration and photoluminescence intensity is found for a range of samples grown at various temperatures and growth rates. In addition, the composition (y) of Bi in GaAs1−yBiy is also found to be linearly related to the GaAs Fröhlich scattering intensity.http://dx.doi.org/10.1063/1.4922139 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Jincheng Li Kamran Forghani Yingxin Guan Wenyuan Jiao Wei Kong Kristen Collar Tong-Ho Kim Thomas F. Kuech April S. Brown |
spellingShingle |
Jincheng Li Kamran Forghani Yingxin Guan Wenyuan Jiao Wei Kong Kristen Collar Tong-Ho Kim Thomas F. Kuech April S. Brown GaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporation AIP Advances |
author_facet |
Jincheng Li Kamran Forghani Yingxin Guan Wenyuan Jiao Wei Kong Kristen Collar Tong-Ho Kim Thomas F. Kuech April S. Brown |
author_sort |
Jincheng Li |
title |
GaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporation |
title_short |
GaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporation |
title_full |
GaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporation |
title_fullStr |
GaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporation |
title_full_unstemmed |
GaAs1−yBiy Raman signatures: illuminating relationships between the electrical and optical properties of GaAs1−yBiy and Bi incorporation |
title_sort |
gaas1−ybiy raman signatures: illuminating relationships between the electrical and optical properties of gaas1−ybiy and bi incorporation |
publisher |
AIP Publishing LLC |
series |
AIP Advances |
issn |
2158-3226 |
publishDate |
2015-06-01 |
description |
We report the use of two Raman signatures, the Bi-induced longitudinal-optical-plasmon-coupled (LOPC) mode and the GaAs Fröhlich scattering intensity, present in nominally undoped (100) GaAs1−yBiy to predict the 300K photoluminescence intensity and Bi composition (y) in GaAs1−yBiy. The LOPC mode is used to calculate the hole concentration in GaAs1−yBiy epitaxial layers. A linear relationship between hole concentration and photoluminescence intensity is found for a range of samples grown at various temperatures and growth rates. In addition, the composition (y) of Bi in GaAs1−yBiy is also found to be linearly related to the GaAs Fröhlich scattering intensity. |
url |
http://dx.doi.org/10.1063/1.4922139 |
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