Mechanism Equivalence in Designing Optimum Step-Stress Accelerated Degradation Test Plan Under Wiener Process

Mechanism Equivalence in Designing Optimum Step-Stress Accelerated Degradation Test Plan Under Wiener Process

To obtain enough reliability information of highly reliable products, step-stress accelerated degradation test becomes more and more popular as it helps to shorten test duration and reduce sample size. A reasonable step-stress accelerated degradation test plan provides a possibility to predict produ...

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Bibliographic Details
Main Authors: Han Wang, Yu Zhao, Xiaobing Ma
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Access
Subjects:
Degradation mechanism equivalence
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step-stress accelerated degradation test
Wiener process
Online Access:https://ieeexplore.ieee.org/document/8246488/

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https://ieeexplore.ieee.org/document/8246488/

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