Contact-free reversible switching of improper ferroelectric domains by electron and ion irradiation
Focused ion beam (FIB) and scanning electron microscopy (SEM) are used to reversibly switch improper ferroelectric domains in the hexagonal manganite ErMnO3. Surface charging is achieved by local ion (positive charging) and electron (positive and negative charging) irradiation, which allows controll...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2021-02-01
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| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/5.0038909 |