Non-contact atomic force microscope: Modeling and simulation using van der Pol averaging method
Topic and aim. One of the tools which are extremely useful and valuable for creating a topography of surfaces, measuring forces, and manipulating material with nano-meter-scale features is the Atomic force microscope (AFM). Since it can create the image of the surface object in different mediums at...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Saratov State University
2021-05-01
|
| Series: | Известия высших учебных заведений: Прикладная нелинейная динамика |
| Subjects: | |
| Online Access: | https://andjournal.sgu.ru/sites/andjournal.sgu.ru/files/text-pdf/2021/05/bahrami.pdf |