Defect Contour Detection of Complex Structural Chips
In the manufacture of chips, it is important to detect defects to assess whether the chip is potentially damageable that could cause unnecessary cost. Most assessment rules are set in light of characteristics determined by defect contours, such as area and range. However, conventional image process...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2021-01-01
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| Series: | Mathematical Problems in Engineering |
| Online Access: | http://dx.doi.org/10.1155/2021/5518675 |