Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes

Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes

Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity without destroying the material. Three complementary ha...

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Bibliographic Details
Main Authors: Eleonora Secco, Heruy Taddese Mengistu, Jaime Segura-Ruíz, Gema Martínez-Criado, Alberto García-Cristóbal, Andrés Cantarero, Bartosz Foltynski, Hannes Behmenburg, Christoph Giesen, Michael Heuken, Núria Garro
Format: Article
Language:English
Published: MDPI AG 2019-05-01
Series:Nanomaterials
Subjects:
semiconductor nanowires
synchrotron probes
nano-scale resolution
Online Access:https://www.mdpi.com/2079-4991/9/5/691

Internet

https://www.mdpi.com/2079-4991/9/5/691

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