An Analysis on the Negative Effect of Multiple-Faults for Spectrum-Based Fault Localization

This paper aims to investigate the negative effects of multiple-faults on spectrum-based fault localization (SBFL). Previously, researchers validated the fact that the occurrence of multiple-faults could have a significant negative impact on fault localization. However, a very little current researc...

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Bibliographic Details
Main Authors: Yan Xiaobo, Bin Liu, Wang Shihai
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8573814/