An Analysis on the Negative Effect of Multiple-Faults for Spectrum-Based Fault Localization
This paper aims to investigate the negative effects of multiple-faults on spectrum-based fault localization (SBFL). Previously, researchers validated the fact that the occurrence of multiple-faults could have a significant negative impact on fault localization. However, a very little current researc...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2019-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8573814/ |