Overview of HVEM Investigations in Materials Science
High-voltage electron microscopy possesses a number of advantages that cannot be afforded by conventional electron microscopy. Topics in recent investigations with HVEMs in materials science are reviewed.
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| Format: | Article |
| Language: | English |
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SpringerOpen
2011-12-01
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| Series: | Journal of Analytical Science and Technology |
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| Online Access: | http://www.jastmag.org/journal/view.php?Type=C&number=49 |
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doaj-45bf2e15510843ecb49633440ee0cb2b |
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Article |
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doaj-45bf2e15510843ecb49633440ee0cb2b2020-11-24T22:09:47ZengSpringerOpenJournal of Analytical Science and Technology2093-31342093-33712011-12-012Supplement AA1A7Overview of HVEM Investigations in Materials ScienceHirotaro MoriHigh-voltage electron microscopy possesses a number of advantages that cannot be afforded by conventional electron microscopy. Topics in recent investigations with HVEMs in materials science are reviewed.http://www.jastmag.org/journal/view.php?Type=C&number=49HVEMpoint defectdislocation loopimplantation |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
Hirotaro Mori |
| spellingShingle |
Hirotaro Mori Overview of HVEM Investigations in Materials Science Journal of Analytical Science and Technology HVEM point defect dislocation loop implantation |
| author_facet |
Hirotaro Mori |
| author_sort |
Hirotaro Mori |
| title |
Overview of HVEM Investigations in Materials Science |
| title_short |
Overview of HVEM Investigations in Materials Science |
| title_full |
Overview of HVEM Investigations in Materials Science |
| title_fullStr |
Overview of HVEM Investigations in Materials Science |
| title_full_unstemmed |
Overview of HVEM Investigations in Materials Science |
| title_sort |
overview of hvem investigations in materials science |
| publisher |
SpringerOpen |
| series |
Journal of Analytical Science and Technology |
| issn |
2093-3134 2093-3371 |
| publishDate |
2011-12-01 |
| description |
High-voltage electron microscopy possesses a number of advantages that cannot be afforded by conventional electron microscopy. Topics in recent investigations with HVEMs in materials science are reviewed. |
| topic |
HVEM point defect dislocation loop implantation |
| url |
http://www.jastmag.org/journal/view.php?Type=C&number=49 |
| work_keys_str_mv |
AT hirotaromori overviewofhveminvestigationsinmaterialsscience |
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