Overview of HVEM Investigations in Materials Science
High-voltage electron microscopy possesses a number of advantages that cannot be afforded by conventional electron microscopy. Topics in recent investigations with HVEMs in materials science are reviewed.
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| Format: | Article |
| Language: | English |
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SpringerOpen
2011-12-01
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| Series: | Journal of Analytical Science and Technology |
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| Online Access: | http://www.jastmag.org/journal/view.php?Type=C&number=49 |