Stress concentration analysis in functionally graded plates with elliptic holes under biaxial

Stress concentration analysis in functionally graded plates with elliptic holes under biaxial

Stress concentration factors (SCFs) at the root of an elliptic hole in unidirectional functionally graded material (UDFGM) plates under uniaxial and biaxial loads are predicted. ANSYS Parametric Design Language (APDL) was used to build the finite element models for the plates and to run the analysis...

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Bibliographic Details
Main Author: Tawakol A. Enab
Format: Article
Language:English
Published: Elsevier 2014-09-01
Series:Ain Shams Engineering Journal
Subjects:
Functionally graded material (FGM)
Stress concentration factor (SCF)
Elliptic hole
Finite element method (FEM)
Uniaxial tension
Biaxial loading
Online Access:http://www.sciencedirect.com/science/article/pii/S2090447914000306

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http://www.sciencedirect.com/science/article/pii/S2090447914000306

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