Melamine Faced Panels Defect Classification beyond the Visible Spectrum
In this work, we explore the use of images from different spectral bands to classify defects in melamine faced panels, which could appear through the production process. Through experimental evaluation, we evaluate the use of images from the visible (VS), near-infrared (NIR), and long wavelength inf...
Main Authors: | Cristhian A. Aguilera, Cristhian Aguilera, Angel D. Sappa |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2018-10-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/18/11/3644 |
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