Melamine Faced Panels Defect Classification beyond the Visible Spectrum

In this work, we explore the use of images from different spectral bands to classify defects in melamine faced panels, which could appear through the production process. Through experimental evaluation, we evaluate the use of images from the visible (VS), near-infrared (NIR), and long wavelength inf...

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Bibliographic Details
Main Authors: Cristhian A. Aguilera, Cristhian Aguilera, Angel D. Sappa
Format: Article
Language:English
Published: MDPI AG 2018-10-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/18/11/3644