Strain driven migration of In during the growth of InAs/GaAs quantum posts

Using the mechano-optical stress sensor technique, we observe a counter-intuitive reduction of the compressive stress when InAs is deposited on GaAs (001) during the growth of quantum posts. Through modelling of the strain fields, we find that such anomalous behaviour can be related to the strain-dr...

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Main Authors: D. Alonso-Álvarez, B. Alén, J. M. Ripalda, A. Rivera, A. G. Taboada, J. M. Llorens, Y. González, L. González, F. Briones
Format: Article
Language:English
Published: AIP Publishing LLC 2013-08-01
Series:APL Materials
Online Access:http://link.aip.org/link/doi/10.1063/1.4818358
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spelling doaj-4177a5a21979419e99402853240ee2ef2020-11-24T22:53:29ZengAIP Publishing LLCAPL Materials2166-532X2013-08-011202211202211210.1063/1.4818358Strain driven migration of In during the growth of InAs/GaAs quantum postsD. Alonso-ÁlvarezB. AlénJ. M. RipaldaA. RiveraA. G. TaboadaJ. M. LlorensY. GonzálezL. GonzálezF. BrionesUsing the mechano-optical stress sensor technique, we observe a counter-intuitive reduction of the compressive stress when InAs is deposited on GaAs (001) during the growth of quantum posts. Through modelling of the strain fields, we find that such anomalous behaviour can be related to the strain-driven detachment of In atoms from the crystal and their surface diffusion towards the self-assembled nanostructures. http://link.aip.org/link/doi/10.1063/1.4818358
collection DOAJ
language English
format Article
sources DOAJ
author D. Alonso-Álvarez
B. Alén
J. M. Ripalda
A. Rivera
A. G. Taboada
J. M. Llorens
Y. González
L. González
F. Briones
spellingShingle D. Alonso-Álvarez
B. Alén
J. M. Ripalda
A. Rivera
A. G. Taboada
J. M. Llorens
Y. González
L. González
F. Briones
Strain driven migration of In during the growth of InAs/GaAs quantum posts
APL Materials
author_facet D. Alonso-Álvarez
B. Alén
J. M. Ripalda
A. Rivera
A. G. Taboada
J. M. Llorens
Y. González
L. González
F. Briones
author_sort D. Alonso-Álvarez
title Strain driven migration of In during the growth of InAs/GaAs quantum posts
title_short Strain driven migration of In during the growth of InAs/GaAs quantum posts
title_full Strain driven migration of In during the growth of InAs/GaAs quantum posts
title_fullStr Strain driven migration of In during the growth of InAs/GaAs quantum posts
title_full_unstemmed Strain driven migration of In during the growth of InAs/GaAs quantum posts
title_sort strain driven migration of in during the growth of inas/gaas quantum posts
publisher AIP Publishing LLC
series APL Materials
issn 2166-532X
publishDate 2013-08-01
description Using the mechano-optical stress sensor technique, we observe a counter-intuitive reduction of the compressive stress when InAs is deposited on GaAs (001) during the growth of quantum posts. Through modelling of the strain fields, we find that such anomalous behaviour can be related to the strain-driven detachment of In atoms from the crystal and their surface diffusion towards the self-assembled nanostructures.
url http://link.aip.org/link/doi/10.1063/1.4818358
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