Whole Slide Imaging for High-Throughput Sensing Antibiotic Resistance at Single-Bacterium Level and Its Application to Rapid Antibiotic Susceptibility Testing

Whole Slide Imaging for High-Throughput Sensing Antibiotic Resistance at Single-Bacterium Level and Its Application to Rapid Antibiotic Susceptibility Testing

Since conventional culture-based antibiotic susceptibility testing (AST) methods are too time-consuming (typically 24−72 h), rapid AST is urgently needed for preventing the increasing emergence and spread of antibiotic resistant infections. Although several phenotypic antibiotic resistance...

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Bibliographic Details
Main Authors: Donghui Song, Haomin Liu, Huayi Ji, Yu Lei
Format: Article
Language:English
Published: MDPI AG 2019-07-01
Series:Molecules
Subjects:
antibiotic resistance
whole slide imaging (WSI)
antibiotic susceptibility testing (AST)
minimum inhibitory concentration (MIC)
single-cell growth rate analysis
Online Access:https://www.mdpi.com/1420-3049/24/13/2441

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https://www.mdpi.com/1420-3049/24/13/2441

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