Inhibition of Crystal Growth during Plasma Enhanced Atomic Layer Deposition by Applying BIAS

In this study, the influence of direct current (DC) biasing on the growth of titanium dioxide (TiO2) layers and their nucleation behavior has been investigated. Titania films were prepared by plasma enhanced atomic layer deposition (PEALD) using Ti(OiPr)4 as metal organic precursor. Oxygen plasma, p...

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Bibliographic Details
Main Authors: Stephan Ratzsch, Ernst-Bernhard Kley, Andreas Tünnermann, Adriana Szeghalmi
Format: Article
Language:English
Published: MDPI AG 2015-11-01
Series:Materials
Subjects:
Online Access:http://www.mdpi.com/1996-1944/8/11/5425