Multi-Labeled Recognition of Distribution System Conditions by a Waveform Feature Learning Model

A waveform contains recognizable feature patterns. To extract the features of various equipment disturbance conditions from a waveform, this paper presents a practical model to estimate distribution line (DL) conditions by means of a multi-label extreme learning machine. The motivation for the wavef...

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Bibliographic Details
Main Authors: Sang-Keun Moon, Jin-O Kim, Charles Kim
Format: Article
Language:English
Published: MDPI AG 2019-03-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/12/6/1115