FPGA-based fault injection design for 16K-point FFT processor

FPGA-based fault injection design for 16K-point FFT processor

There are a number of satellites working in the harsh space environment. The charged particles in space may strike the electron devices causing the undesired influences, such as soft errors in memory devices or permanent damage in hardware circuits. Aiming at reliability evaluation of very-large-sca...

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Bibliographic Details
Main Authors: Chuang-An Mao, Yu Xie, Xin Wei, Yi-Zhuang Xie, He Chen
Format: Article
Language:English
Published: Wiley 2019-10-01
Series:The Journal of Engineering
Subjects:
fast fourier transforms
radiation hardening (electronics)
sram chips
field programmable gate arrays
space vehicle electronics
vlsi
microprocessor chips
integrated circuit design
integrated circuit testing
integrated circuit reliability
fpga-based fault injection design
16k-point fft processor
satellites
electron devices
memory devices
permanent damage
hardware circuits
reliability evaluation
very-large-scale integration circuits
soft error mitigation controller
transformation processor
fault injection method
sram
reliability testing techniques
design under test
dut
resource consumption
golden data
16k-point fast fourier transformation processor
Online Access:https://digital-library.theiet.org/content/journals/10.1049/joe.2019.0703

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https://digital-library.theiet.org/content/journals/10.1049/joe.2019.0703

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