Defect Detection for Patterned Fabric Images Based on GHOG and Low-Rank Decomposition

Defect Detection for Patterned Fabric Images Based on GHOG and Low-Rank Decomposition

In contrast to defect-free fabric images with macro-homogeneous textures and regular patterns, the fabric images with the defect are characterized by the defect regions that are salient and sparse among the redundant background. Therefore, as an effective tool for separating an image into a redundan...

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Bibliographic Details
Main Authors: Chunlei Li, Guangshuai Gao, Zhoufeng Liu, Di Huang, Jiangtao Xi
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Patterned fabric
defect detection
GHOG
low-rank decomposition
ADMM
Online Access:https://ieeexplore.ieee.org/document/8746161/

Internet

https://ieeexplore.ieee.org/document/8746161/

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