Enhanced sputtering of Ge nanowires under synergetic effect of Mn ion and electron beams

To monitor the damage evolution in Ge nanowires during Mn implantation, in situ transmission electron microscopy observations were carried-out as a function of the Mn fluence. Special interest lies in the sputtering of nanowires. We evidence an enhanced sputtering under the synergetic effects of Mn...

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Bibliographic Details
Main Authors: L. Vincent, M. Fakhfakh, G. Patriarche, C. Renard, D. Bouchier
Format: Article
Language:English
Published: Elsevier 2017-01-01
Series:Results in Physics
Online Access:http://www.sciencedirect.com/science/article/pii/S2211379717308367