Communication: The formation of rarefaction waves in semiconductors after ultrashort excitation probed by grazing incidence ultrafast time-resolved x-ray diffraction

We explore the InSb-semiconductor lattice dynamics after excitation of high density electron-hole plasma with an ultrashort and intense laser pulse. By using time resolved x-ray diffraction, a sub-mÅ and sub-ps resolution was achieved. Thus, a strain of 4% was measured in a 3 nm thin surface layer 2...

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Bibliographic Details
Main Authors: S. Höfer, T. Kämpfer, E. Förster, T. Stöhlker, I. Uschmann
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2016-09-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/1.4963011