Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk
Background Test resources are usually limited and therefore it is often not possible to completely test an application before a release. To cope with the problem of scarce resources, development teams can apply defect prediction to identify fault-prone code regions. However, defect prediction tends...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
PeerJ Inc.
2019-04-01
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| Series: | PeerJ Computer Science |
| Subjects: | |
| Online Access: | https://peerj.com/articles/cs-187.pdf |