Identifying intrinsic ferroelectricity of thin film with piezoresponse force microscopy
Piezoresponse force microscopy (PFM) is a powerful technique to characterize ferroelectric thin films by measuring the dynamic electromechanical response. The ferroelectricity is commonly demonstrated by the PFM hysteresis loops and a 180o phase difference of PFM images before and after poling. Such...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-09-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4999199 |