Mechanical properties of silicon in subsurface damage layer from nano-grinding studied by atomistic simulation
Ultra-thin silicon wafer is highly demanded by semi-conductor industry. During wafer thinning process, the grinding technology will inevitably induce damage to the surface and subsurface of silicon wafer. To understand the mechanism of subsurface damage (SSD) layer formation and mechanical propertie...
Main Authors: | Zhiwei Zhang, Pei Chen, Fei Qin, Tong An, Huiping Yu |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2018-05-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/1.5021654 |
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