Mechanical properties of silicon in subsurface damage layer from nano-grinding studied by atomistic simulation

Ultra-thin silicon wafer is highly demanded by semi-conductor industry. During wafer thinning process, the grinding technology will inevitably induce damage to the surface and subsurface of silicon wafer. To understand the mechanism of subsurface damage (SSD) layer formation and mechanical propertie...

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Bibliographic Details
Main Authors: Zhiwei Zhang, Pei Chen, Fei Qin, Tong An, Huiping Yu
Format: Article
Language:English
Published: AIP Publishing LLC 2018-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5021654