Toward Accurate Quantitative Elasticity Mapping of Rigid Nanomaterials by Atomic Force Microscopy: Effect of Acquisition Frequency, Loading Force, and Tip Geometry
Atomic force microscopy (AFM) has emerged as a popular tool for the mechanical mapping of soft nanomaterials due to its high spatial and force resolution. Its applications in rigid nanomaterials, however, have been underexplored. In this work, we studied elasticity mapping of common rigid materials...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2018-08-01
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| Series: | Nanomaterials |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-4991/8/8/616 |