Fractal Anti-Counterfeit Label Comparison Using Combined Image Features and Clustering

The comparison of traditional fractal anti-counterfeit labels is based mainly on manual inspection. However, such labels have rich details and complex structures, making the entire identification process labor-intensive. Thus, manual inspections are highly susceptible to low identification accuracy,...

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Bibliographic Details
Main Authors: Wen Wang, Guoyong Han, Guanglei Sun
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9146652/