Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

This study deals with the preparation and characterization of metallic nanoinclusions on the surface of semiconducting Bi2Se3 that could be used for an enhancement of the efficiency of thermoelectric materials. We used Au forming a 1D alloy through diffusion (point nanoinclusion) and Mo forming ther...

Full description

Bibliographic Details
Main Authors: Petr Knotek, Tomáš Plecháček, Jan Smolík, Petr Kutálek, Filip Dvořák, Milan Vlček, Jiří Navrátil, Čestmír Drašar
Format: Article
Language:English
Published: Beilstein-Institut 2019-07-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Kelvin probe atomic force microscope
nanoinclusion
Schottky barrier
thermoelectric materials
work function
Online Access:https://doi.org/10.3762/bjnano.10.138

Internet

https://doi.org/10.3762/bjnano.10.138

Similar Items