New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection
This paper presents a new parametric fault detection (PFD) approach for testing of linear analog circuits. It combines classified frequency-bands with amplitude weighting for fault controllability and test-points selection for fault observability. The test waveform sweeps on an applicable frequency-...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2021-06-01
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| Series: | Ain Shams Engineering Journal |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2090447920302276 |