Generation of two‐dimensional electron gas to normally depleted AlGaN/GaN hetero‐interface by SiO2 deposition and subsequent high‐temperature annealing
Abstract SiO2 film deposition and subsequent high‐temperature annealing resulted in the generation of a two‐dimensional electron gas (2DEG) at Al(Ga)N/GaN hetero‐interfaces, of which the 2DEG was originally fully depleted. The obtained mobilities and sheet carrier concentrations were over 1100 cm2/V...
Main Authors: | T. Nanjo, H. Koyama, T. Imazawa, A. Kiyoi, A. Imai, T. Hayashida, T. Watahiki, Y. Yamamoto, N. Miura |
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Format: | Article |
Language: | English |
Published: |
Wiley
2021-08-01
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Series: | Electronics Letters |
Online Access: | https://doi.org/10.1049/ell2.12213 |
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