Generation of two‐dimensional electron gas to normally depleted AlGaN/GaN hetero‐interface by SiO2 deposition and subsequent high‐temperature annealing

Abstract SiO2 film deposition and subsequent high‐temperature annealing resulted in the generation of a two‐dimensional electron gas (2DEG) at Al(Ga)N/GaN hetero‐interfaces, of which the 2DEG was originally fully depleted. The obtained mobilities and sheet carrier concentrations were over 1100 cm2/V...

Full description

Bibliographic Details
Main Authors: T. Nanjo, H. Koyama, T. Imazawa, A. Kiyoi, A. Imai, T. Hayashida, T. Watahiki, Y. Yamamoto, N. Miura
Format: Article
Language:English
Published: Wiley 2021-08-01
Series:Electronics Letters
Online Access:https://doi.org/10.1049/ell2.12213