Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among...
Main Authors: | Giulio Guzzinati, Thomas Altantzis, Maria Batuk, Annick De Backer, Gunnar Lumbeeck, Vahid Samaee, Dmitry Batuk, Hosni Idrissi, Joke Hadermann, Sandra Van Aert, Dominique Schryvers, Johan Verbeeck, Sara Bals |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2018-07-01
|
Series: | Materials |
Subjects: | |
Online Access: | http://www.mdpi.com/1996-1944/11/8/1304 |
Similar Items
-
Caractérisation de microtextures par la technique ACOM-TEM dans le cadre du développement des technologies avancées en microélectronique
by: Valery, Alexia
Published: (2017) -
New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy
by: Edgar F. Rauch, et al.
Published: (2021-09-01) -
In situ mechanical characterization of silver nanowire/graphene hybrids films for flexible electronics
by: Ke Cao, et al.
Published: (2020-07-01) -
Deformation-induced grain growth and twinning in nanocrystalline palladium thin films
by: Aaron Kobler, et al.
Published: (2013-09-01) -
Microstructural Evidence for Grain Boundary Migration and Dynamic Recrystallization in Experimentally Deformed Forsterite Aggregates
by: Caroline Bollinger, et al.
Published: (2018-12-01)