Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among...

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Bibliographic Details
Main Authors: Giulio Guzzinati, Thomas Altantzis, Maria Batuk, Annick De Backer, Gunnar Lumbeeck, Vahid Samaee, Dmitry Batuk, Hosni Idrissi, Joke Hadermann, Sandra Van Aert, Dominique Schryvers, Johan Verbeeck, Sara Bals
Format: Article
Language:English
Published: MDPI AG 2018-07-01
Series:Materials
Subjects:
TEM
electron diffraction tomography
STEM
atom counting
electron tomography
compressed sensing
EDS
EELS
nanomechanical testing
ACOM TEM
Online Access:http://www.mdpi.com/1996-1944/11/8/1304

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