Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among...

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Main Authors: Giulio Guzzinati, Thomas Altantzis, Maria Batuk, Annick De Backer, Gunnar Lumbeeck, Vahid Samaee, Dmitry Batuk, Hosni Idrissi, Joke Hadermann, Sandra Van Aert, Dominique Schryvers, Johan Verbeeck, Sara Bals
Format: Article
Language:English
Published: MDPI AG 2018-07-01
Series:Materials
Subjects:
TEM
EDS
Online Access:http://www.mdpi.com/1996-1944/11/8/1304
id doaj-2c31088903c44e5eb3d10e83ec18c345
record_format Article
spelling doaj-2c31088903c44e5eb3d10e83ec18c3452020-11-25T01:08:07ZengMDPI AGMaterials1996-19442018-07-01118130410.3390/ma11081304ma11081304Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of AntwerpGiulio Guzzinati0Thomas Altantzis1Maria Batuk2Annick De Backer3Gunnar Lumbeeck4Vahid Samaee5Dmitry Batuk6Hosni Idrissi7Joke Hadermann8Sandra Van Aert9Dominique Schryvers10Johan Verbeeck11Sara Bals12EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumThe rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.http://www.mdpi.com/1996-1944/11/8/1304TEMelectron diffraction tomographySTEMatom countingelectron tomographycompressed sensingEDSEELSnanomechanical testingACOM TEM
collection DOAJ
language English
format Article
sources DOAJ
author Giulio Guzzinati
Thomas Altantzis
Maria Batuk
Annick De Backer
Gunnar Lumbeeck
Vahid Samaee
Dmitry Batuk
Hosni Idrissi
Joke Hadermann
Sandra Van Aert
Dominique Schryvers
Johan Verbeeck
Sara Bals
spellingShingle Giulio Guzzinati
Thomas Altantzis
Maria Batuk
Annick De Backer
Gunnar Lumbeeck
Vahid Samaee
Dmitry Batuk
Hosni Idrissi
Joke Hadermann
Sandra Van Aert
Dominique Schryvers
Johan Verbeeck
Sara Bals
Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
Materials
TEM
electron diffraction tomography
STEM
atom counting
electron tomography
compressed sensing
EDS
EELS
nanomechanical testing
ACOM TEM
author_facet Giulio Guzzinati
Thomas Altantzis
Maria Batuk
Annick De Backer
Gunnar Lumbeeck
Vahid Samaee
Dmitry Batuk
Hosni Idrissi
Joke Hadermann
Sandra Van Aert
Dominique Schryvers
Johan Verbeeck
Sara Bals
author_sort Giulio Guzzinati
title Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
title_short Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
title_full Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
title_fullStr Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
title_full_unstemmed Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
title_sort recent advances in transmission electron microscopy for materials science at the emat lab of the university of antwerp
publisher MDPI AG
series Materials
issn 1996-1944
publishDate 2018-07-01
description The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science.
topic TEM
electron diffraction tomography
STEM
atom counting
electron tomography
compressed sensing
EDS
EELS
nanomechanical testing
ACOM TEM
url http://www.mdpi.com/1996-1944/11/8/1304
work_keys_str_mv AT giulioguzzinati recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT thomasaltantzis recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT mariabatuk recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT annickdebacker recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT gunnarlumbeeck recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT vahidsamaee recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT dmitrybatuk recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT hosniidrissi recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT jokehadermann recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT sandravanaert recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT dominiqueschryvers recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT johanverbeeck recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
AT sarabals recentadvancesintransmissionelectronmicroscopyformaterialsscienceattheematlaboftheuniversityofantwerp
_version_ 1725184107662540800