GMM Clustering-Based Decision Trees Considering Fault Rate and Cluster Validity for Analog Circuit Fault Diagnosis
Traditional decision trees for fault diagnosis often use an ID3 construction algorithm. For promoting the accuracy and efficiency of decision trees, considering the cluster validity and fault rates, this paper proposes two improved trees, CV-DTs and FR-DTs. This paper mainly has two highlights. The...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2019-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8847300/ |