Probabilistic modeling of noise transfer characteristics in digital circuits
Device scaling, the driving force of CMOS technology, led to continuous decrease in the energy level representing logic states. The resulting small noise margins in combination with increasing problems regarding the supply voltage stability and process variability creates a design conflict between e...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2011-08-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/9/269/2011/ars-9-269-2011.pdf |