Electric Current Dependent Fracture in GaN Piezoelectric Semiconductor Ceramics

In this paper, the fracture behavior of GaN piezoelectric semiconductor ceramics was investigated under combined mechanical and electric loading by using three-point bending tests and numerical analysis. The experimental results demonstrate that, in contrast to traditional insulating piezoelectric c...

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Bibliographic Details
Main Authors: Guoshuai Qin, Chunsheng Lu, Xin Zhang, Minghao Zhao
Format: Article
Language:English
Published: MDPI AG 2018-10-01
Series:Materials
Subjects:
Online Access:http://www.mdpi.com/1996-1944/11/10/2000