Piezoelectric Properties of Pb<sub>1−x</sub>La<sub>x</sub>(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)<sub>1−x/4</sub>O<sub>3</sub> Thin Films Studied by In Situ X-ray Diffraction

Piezoelectric Properties of Pb<sub>1−x</sub>La<sub>x</sub>(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)<sub>1−x/4</sub>O<sub>3</sub> Thin Films Studied by In Situ X-ray Diffraction

The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb<sub>1−x</sub>La<sub>x</sub>(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)<sub>1−x/4</sub>O<sub>3</sub> thin films, with <i>x</i> = 0, 3 and 12 mol%...

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Bibliographic Details
Main Authors: Thomas W. Cornelius, Cristian Mocuta, Stéphanie Escoubas, Luiz R. M. Lima, Eudes B. Araújo, Andrei L. Kholkin, Olivier Thomas
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Materials
Subjects:
X-ray diffraction
piezoelectric properties
lanthanum-modified lead zirconate titanate (PLZT)
Online Access:https://www.mdpi.com/1996-1944/13/15/3338

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https://www.mdpi.com/1996-1944/13/15/3338

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